Test pattern for living /Author: Johnson, Nicholas,
Publisher: Morrisville, North Carolina : Lulu Press,
Date: 2013. This title can be found in 1 Iowa libraries.
Application of a reconfigurable computing platform to an automatic test pattern generation algorithm /Author: Lown, Brian L.
Publisher: [Place of publication not identified] : [publisher not identified],
Date: 2001. This title can be found in 1 Iowa libraries.
Efficient branch and bound search with application to computer-aided design /Author: Chen, Xinghao,
Publisher: Boston : Kluwer Academic Publishers,
Date: c1996. This title can be found in 2 Iowa libraries.
Operator's, organizational, direct support, and general support maintenance manual for generator, test pattern SG-1223/T (NSN 6625-01-127-6846).Publisher: [Washington, DC] : Departments of the Army, Navy, and Air Force,
Date: [1990] This title can be found in 1 Iowa libraries.
Organizational, direct support, and general support maintenance ... for generator, test pattern SG-1223/T (NSN 6625-01-127-6846).Publisher: [Washington, DC] : Departments of the Army, Navy, and Air Force,
Date: [1990] This title can be found in 1 Iowa libraries.
An automatic test pattern generator for delay faults in logic circuits /Author: Patil, Srinivas.
Publisher: [Place of publication not identified] : [publisher not identified],
Date: 1987. This title can be found in 1 Iowa libraries.
Implementation of an automatic test pattern generator for MOS combinational circuits /Author: Wieland, Douglas P.
Publisher: [Place of publication not identified] : [publisher not identified],
Date: 1985. This title can be found in 1 Iowa libraries.
The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control /Author: Linholm, Loren W.
Publisher: Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., For sale by the Supt. of Docs., U.S. G.P.O.,
Date: 1981. This title can be found in 1 Iowa libraries.
Comprehensive test pattern and approach for characterizing SOS technology /Author: Ham, W. E.
Publisher: [Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1980. This title can be found in 3 Iowa libraries.
A production-compatible microelectronic test pattern for evaluating photomask misalignment /Author: Russell, T. J.
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1979. This title can be found in 2 Iowa libraries.
Microelectronic test pattern NBS-4 /Author: Thurber, W. Robert.
Publisher: Washington : Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1978. This title can be found in 1 Iowa libraries.
Microelectronic test pattern NBS-4 /Author: Thurber, W. Robert.
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1978. This title can be found in 2 Iowa libraries.
Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of silicon /Author: Buehler, Martin G.
Publisher: [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1976. This title can be found in 2 Iowa libraries.
The minister is leaving: a Project Test Pattern book in parish developmentAuthor: Hahn, Celia A.
Publisher: New York, Seabury Press
Date: [1974] This title can be found in 2 Iowa libraries.
Test pattern for livingFormat: [sound recording] /
Publisher: [Waverly, Iowa : Wartburg College,
Date: 1974] This title can be found in 1 Iowa libraries.
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