Cluster secondary ion mass spectrometry : principles and applications /Author: Mahoney, Christine M.,
Publisher: Hoboken, New Jersey : Wiley,
Date: [2013] This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry in the earth sciences : gleaning the big picture from a small spot /Publisher: Toronto : Mineralogical Association of Canada,
Date: c2009. This title can be found in 2 Iowa libraries.
Analylsis of LDEF experiment AO137-2 : chemically and isotopic measurements of micrometeroids by secondary ion mass spectrometry.Publisher: [Washington, DC] : [National Aeronautics and Space Administration],
Date: [1992] This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : principles and applications /Publisher: New York : Oxford University Press, Oxford ; New York : Oxford University Press,
Date: 1989. This title can be found in 3 Iowa libraries.
Handbook of static secondary ion mass spectrometry /Author: Briggs, D.
Publisher: New York : New York : J. Wiley,
Date: c1989. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /Author: Benninghoven, A.
Publisher: New York : J. Wiley,
Date: 1987. This title can be found in 3 Iowa libraries.
Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /Publisher: New York : New York : Springer-Verlag,
Date: c1986. This title can be found in 1 Iowa libraries.
Auger electron spetroscopy, secondary ion mass spectrometry and optical characterization of a-C:H and BN filmsFormat: [microform] /
Author: Pouch, John J.
Publisher: [Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center,
Date: 1986] This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /Publisher: New York : New York : Springer-Verlag,
Date: 1984. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 /Publisher: New York : New York : Springer Verlag,
Date: 1982. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /Publisher: New York : Springer-Verlag,
Date: 1979. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 /Publisher: Washington : For sale by the Supt. of Docs., U.S. Govt. Print. Off., For sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1975. This title can be found in 1 Iowa libraries.
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