Secondary ion mass spectrometry : an introduction to principles and practices /Author: Van der Heide, Paul,
Publisher: Hoboken, New Jersey : Wiley,
Date: [2014] This title can be found in 1 Iowa libraries.
Cluster secondary ion mass spectrometry : principles and applications /Author: Mahoney, Christine M.,
Publisher: Hoboken, New Jersey : Wiley,
Date: [2013] This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry in the earth sciences : gleaning the big picture from a small spot /Publisher: Toronto : Mineralogical Association of Canada,
Date: c2009. This title can be found in 2 Iowa libraries.
Surface analysis of polymers by XPS and static SIMS /Author: Briggs, D.
Publisher: New York : New York : Cambridge University Press,
Date: 1998. This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry : principles and applications /Publisher: New York : Oxford University Press, Oxford ; New York : Oxford University Press,
Date: 1989. This title can be found in 3 Iowa libraries.
Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Mùˆnster, Federal Republic of Germany, September 21-23, 1987 /Publisher: New York : New York : Wiley,
Date: c1989. This title can be found in 1 Iowa libraries.
Handbook of static secondary ion mass spectrometry /Author: Briggs, D.
Publisher: New York : New York : J. Wiley,
Date: c1989. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /Author: Benninghoven, A.
Publisher: New York : J. Wiley,
Date: 1987. This title can be found in 3 Iowa libraries.
Secondary ion mass spectroscopy of solid surfaces /Author: Cherepin, Valentin Tikhonovich
Publisher: Utrecht, The Netherlands : VNU Science Press,
Date: 1987. This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /Publisher: New York : New York : Springer-Verlag,
Date: c1986. This title can be found in 1 Iowa libraries.
Desorption mass spectrometry : are SIMS and FAB the same? /Publisher: Washington, D.C. : American Chemical Society,
Date: 1985. This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /Publisher: New York : New York : Springer-Verlag,
Date: 1984. This title can be found in 1 Iowa libraries.
Ion formation from organic solids : proceedings of the second international conference, Mùˆnster, Fed. Rep. of Germany, September 7-9, 1982 /Publisher: New York : New York : Springer-Verlag,
Date: 1983. This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 /Publisher: New York : New York : Springer Verlag,
Date: 1982. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 /Publisher: Washington : For sale by the Supt. of Docs., U.S. Govt. Print. Off., For sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1975. This title can be found in 1 Iowa libraries.
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