Ionizing radiation effects in electronics : from memories to imagers /Publisher: Boca Raton ; CRC Press :
Date: [2016] This title can be found in 1 Iowa libraries.
ESD testing : from components to systems /Author: Voldman, Steven H.,
Publisher: Chichester, UK ; John Wiley & Sons,
Date: 2016. This title can be found in 2 Iowa libraries.
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