Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /Publisher: New York : New York : Springer-Verlag,
Date: c1986. This title can be found in 1 Iowa libraries.
Desorption mass spectrometry : are SIMS and FAB the same? /Publisher: Washington, D.C. : American Chemical Society,
Date: 1985. This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /Publisher: New York : New York : Springer-Verlag,
Date: 1984. This title can be found in 1 Iowa libraries.
Ion formation from organic solids : proceedings of the second international conference, Mùˆnster, Fed. Rep. of Germany, September 7-9, 1982 /Publisher: New York : New York : Springer-Verlag,
Date: 1983. This title can be found in 2 Iowa libraries.
Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 /Publisher: New York : New York : Springer Verlag,
Date: 1982. This title can be found in 1 Iowa libraries.
Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 /Publisher: Washington : For sale by the Supt. of Docs., U.S. Govt. Print. Off., For sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Date: 1975. This title can be found in 1 Iowa libraries.
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