Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films. /Author: Wolstenholme, John,
Publisher: New York, NY : Momentum Press,
Date: [2015] This title can be found in 1 Iowa libraries.
Catalysts and surfaces : characterization techniques /Author: Viswanathan, B.
Publisher: Oxford : Alpha Science International,
Date: c2010. This title can be found in 1 Iowa libraries.
Core level spectroscopy of solids /Author: Groot, Frank de,
Publisher: Boca Raton : CRC Press,
Date: c2008. This title can be found in 1 Iowa libraries.
Electronic and photoelectron spectroscopy : fundamentals and case studies /Author: Ellis, Andrew M.
Publisher: New York : New York : Cambridge University Press,
Date: 2005. This title can be found in 6 Iowa libraries.
Nanoscale spectroscopy and its applications to semiconductor research /Publisher: New York : New York : Springer,
Date: c2002. This title can be found in 2 Iowa libraries.
Surface and thin film analysis : principles, instrumentation, applications /Publisher: Weinheim : Wiley-VCH,
Date: c2002. This title can be found in 2 Iowa libraries.
Electron spectroscopies applied to low-dimensional structures /Publisher: Boston, MA : Boston, MA : Kluwer Academic Publishers,
Date: 2000. This title can be found in 4 Iowa libraries.
Electron momentum spectroscopy /Author: Weigold, Erich.
Publisher: New York : Kluwer Academic/Plenum Publishers,
Date: 1999. This title can be found in 1 Iowa libraries.
Track structure model for radial distributions of electron spectra and event spectra from high-energy ionsFormat: [microform] /
Author: Cucinotta, Francis A.
Publisher: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ;
Date: [1998] This title can be found in 2 Iowa libraries.
Electron spectrometry of atoms using synchrotron radiation /Author: Schmidt, Volker,
Publisher: New York : New York : Cambridge University Press,
Date: 1997. This title can be found in 1 Iowa libraries.
Comparison of spacecraft contamination models with well-defined flight experiment NAS8-40581, progress report for May 15, 1997 to August 15, 1997 /Format: [microform] :
Author: Pippin, Gary.
Publisher: [Washington, DC : National Aeronautics and Space Administration ;
Date: 1997] This title can be found in 2 Iowa libraries.
Electron scattering and related spectroscopies /Author: De Crescenzi, M.
Publisher: River Edge, NJ : River Edge, NJ : World Scientific,
Date: c1996. This title can be found in 1 Iowa libraries.
Heavy ion track-structure calculations for radial dose in arbitrary materialsFormat: [microform] /
Publisher: Springfield, Va. : National Technical Information Service, distributor, Linthicum Heights, MD : NASA Center for AeroSpace Information, distributor ; Springfield, Va. : National Technical Information Service, distributor,
Date: [1995] This title can be found in 2 Iowa libraries.
Modern ESCA : the principles and practice of x-ray photoelectron spectroscopy /Author: Barr, T. L.
Publisher: Boca Raton : CRC Press,
Date: c1994. This title can be found in 3 Iowa libraries.
Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992 /Publisher: Philadelphia : Institute of Physics Pub., Bristol, UK ; Philadelphia : Institute of Physics Pub.,
Date: c1993. This title can be found in 1 Iowa libraries.
Electron spectroscopy analysis final report, April 13, 1990-April 12, 1992 /Format: [microform] :
Author: Gregory, John C.
Publisher: Springfield, Va. : National Technical Information Service, distributor, [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor,
Date: 1992] This title can be found in 2 Iowa libraries.
Total current spectroscopy of surfaces /Author: Komolov, S. A.
Publisher: Philadelphia : Gordon and Breach Science Publishers,
Date: c1992. This title can be found in 1 Iowa libraries.
Handbook of x-ray photoelectron spectroscopy : a reference book of standard spectra for identification and interpretation of XPS data /Publisher: Eden Prairie, Minn. : Physical Electronics Division, Perkin-Elmer Corp.,
Date: c1992. This title can be found in 1 Iowa libraries.
An introduction to surface analysis by electron spectroscopy /Author: Watts, John F.
Publisher: Oxford [England] : New York : Royal Microscopical Society, Oxford [England] : Royal Microscopical Society,
Date: 1990. This title can be found in 2 Iowa libraries.
Surface analysis techniques and applications /Publisher: Cambridge [England] : Royal Society of Chemistry,
Date: c1990. This title can be found in 2 Iowa libraries.
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