The Locator -- [(author = "Benninghoven A")]

8 records matched your query       



Record 1
Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 / Publisher: New York : New York : Wiley, Date: c1989.   This title can be found in 1 Iowa libraries.
Record 2
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / Author: Benninghoven, A. Publisher: New York : J. Wiley, Date: 1987.   This title can be found in 3 Iowa libraries.
Record 3
Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 / Publisher: New York : New York : Springer-Verlag, Date: c1986.   This title can be found in 1 Iowa libraries.
Record 4
Ion formation from organic solids (IFOS III) : mass spectrometry of involatile material : proceedings of the third International Conference, Münster, Fed. Rep. of Germany, September 16-18, 1985 / Publisher: New York : New York : Springer-Verlag, Date: c1986.   This title can be found in 2 Iowa libraries.
Record 5
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / Publisher: New York : New York : Springer-Verlag, Date: 1984.   This title can be found in 1 Iowa libraries.
Record 6
Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 / Publisher: New York : New York : Springer-Verlag, Date: 1983.   This title can be found in 2 Iowa libraries.
Record 7
Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 / Publisher: New York : New York : Springer Verlag, Date: 1982.   This title can be found in 1 Iowa libraries.
Record 8
Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 / Publisher: New York : Springer-Verlag, Date: 1979.   This title can be found in 1 Iowa libraries.

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