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01461aam a22003617a 4500 001 C1F85E2465D411E6868A95C7DAD10320 003 SILO 005 20160819010408 008 991021s1999 ohu b f000 0 eng d 035 $a (OCoLC)42680034 040 $a GPO $c GPO $d DLC $d MvI $d SILO 074 $a 0830-H-14 (MF) 086 0 $a NAS 1.26:208874 100 1 $a Shbeeb, N. I. 245 10 $a Analysis of an interface creack for a functionally graded strip sandwiched between two homogeneous layers of finite $h [microform] / $c N.I. Shbeeb and W.K. Binienda 260 $a [Cleveland, Ohio] : $b National Aeronautics and Space Administration, Lewis Research Center ; $c [1999] 300 $a 1 v. 490 1 $a [NASA contractor report] ; $v NASA/CR-208874 500 $a Shipping list no.: 1999-0729-M. 533 $a Microfiche. $b [Washington, D.C. : $c National Aeronautics and Space Administration, $d 1999] $e 1 microfiche. 650 7 $a Cracks. $2 nasat 650 7 $a Homogeneity. $2 nasat 650 7 $a Singular integral equations. $2 nasat 650 7 $a Cauchy problem $2 nasat 650 7 $a Chebyshev approximation $2 nasat 650 7 $a Stress intensity factors. $2 nasat 700 1 $a Binienda, Wieslaw K. 710 2 $a Lewis Research Center 830 0 $a NASA contractor report $v 208874. 941 $a 2 952 $l OVUX522 $d 20180116062022.0 952 $l USUX851 $d 20160819065504.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=C1F85E2465D411E6868A95C7DAD10320Initiate Another SILO Locator Search