16 records matched your query       

Title:

Ion spectroscopies for surface analysis / edited by A.W. Czanderna and David M. Hercules.

Publisher:

Plenum Press,

Copyright Date:

c1991

Description:

xvii, 469 p. : ill. ; 24 cm.

Subject:

Secondary ion mass spectrometry.
Solids--Analysis.--Analysis.
Surface chemistry.

Other Authors:

Czanderna, Alvin Warren, 1930-
Hercules, David M.,

Notes:

Includes bibliographical references and index.

Contents:

Overview of ion spectroscopies for surface compositional analysis / A.W. Czanderna -- Surface structure and reaction studies by ion-solid collisions / Nicholas Winograd and Barbara J. Garrison -- Particle-induced desorption ionization techniques for organic mass spectrometry / Kenneth L. Busch -- Laser resonant and nonresonant photoionization of sputtered neutrals / Christopher H. Becker -- Rutherford backscattering and nuclear reaction analysis / L.C. Feldman -- Ion scattering spectroscopy / E. Taglauer -- Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS methods for surface compositional analysis / C.J. Powell, D.M. Hercules, and A.W. Czanderna.

Series:

Methods of surface characterization ; v. 2

ISBN:

9780306437922
0306437929

LCCN:

91019636

Locations:

USUX851 -- Iowa State University - Parks Library (Ames)