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Author:

Mahoney, Christine M., 1975- author.

Title:

Cluster secondary ion mass spectrometry : principles and applications / edited by Christine M. Mahoney.

Publisher:

Wiley,

Copyright Date:

2013

Description:

xiii, 348 pages : illustrations (some color) ; 25 cm.

Subject:

Secondary ion mass spectrometry.

Notes:

Includes bibliographical references and index.

Contents:

Future challenges and the prospects of cluster SIMS / Peter Williams and Christine M. Mahoney. Cluster SIMS of organic materials: theoretical insights / Arnaud Delcorte, Oscar A . Restrepo, and Bartlomiej Czerwinski -- Ion sources used for secondary ion mass spectrometry / Albert J. Fahey -- Surface analysis of organic materials with polyatomic primary ion sources / Christine M. Mahoney -- Molecular depth profiling with cluster ion beams / Christine M. Mahoney and Andreas Wucher -- Three-dimensional imaging with cluster ions beams / Andreas Wucher, Gregory L. Fisher, and Christine M. Mahoney -- Cluster secondary ion mass spectometry (SIMS) for semiconductor and metals depth profiling / Greg Gillen and Joe Bennett -- Cluster TOF-SIMS imaging and the characterization of biological materials / John Vickerman and Nick Winogrand -- Future challenges and the prospects of cluster SIMS / Peter Williams and Christine M. Mahoney.

Series:

Wiley series on mass spectrometry

ISBN:

0470886056 (hbk.)
9780470886052 (hbk.)

OCLC:

(OCoLC)829055718

Locations:

USUX851 -- Iowa State University - Parks Library (Ames)

OVUX522 -- University of Iowa Libraries (Iowa City)