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01422pam a2200409 a 4500 001 498352942AE211DEBFD10D06A8D7520A 005 200904161857.0 008 860418s1987 nyua b 001 0 eng 010 $a 86011014 020 $a 9780471010562 020 $a 0471010561 035 $a (OCoLC)13525968 035 $a (OCoLC)16079212 040 $a DLC $c DLC $d SILO $d UBA $d IWA $d SILO 050 0 $a QD96.S43 $b B46 1987 082 0 $a 543/.0873 $2 19 100 1 $a Benninghoven, A. 245 1 $a Secondary ion mass spectrometry : $b basic concepts, instrumental aspects, applications, and trends / $c A. Benninghoven, F.G. RuÌdenauer, H.W. Werner. 260 0 $a New York : $b J. Wiley, $c 1987. 300 $a xxxv, 1227 p. : $b ill. ; $c 24 cm. 440 0 $a Chemical analysis ; $v v. 86 500 $a "A Wiley-Interscience publication." 500 $a Includes index. 504 $a Bibliography: p. 1125-1216. 650 0 $a Secondary ion mass spectrometry. 650 7 $a Espectroscopia de massa $2 larpcal 650 7 $a Espectroscopia $2 larpcal 653 $a Secondary ion mass spectrometry 700 1 $a RuÌdenauer, F. G. 700 1 $a Werner, H. W. 939 $a 1971698 941 $a 3 952 $l ULAX314 $d 20190926050727.0 952 $l OVUX522 $d 20171228050320.0 952 $l USUX851 $d 20160820094549.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=498352942AE211DEBFD10D06A8D7520A 994 $a 02 $b IWAInitiate Another SILO Locator Search