The Locator -- [(subject = "Secondary ion mass spectrometry")]

16 records matched your query       


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01311pam a2200349 a 4500
001 4980E5682AE211DEBFD10D06A8D7520A
005 200904161857.0
008 881125s1989    enkaf    b    00100 eng  
010    $a 88038479
020    $a 9780471519454
020    $a 0471519456
020    $a 9780198556251
020    $a 019855625X
040    $a DLC $c DLC $d SILO $d SILO
050 00 $a QD96.S43 $b S4 1989
082 00 $a 543/.0873 $2 19
245 0  $a Secondary ion mass spectrometry : $b principles and applications / $c edited by John C. Vickerman, Alan Brown, and Nicola M. Reed.
260 0  $a New York : $b Oxford University Press, $a Oxford ; $a New York : $b Oxford University Press, $c 1989.
300    $a xii, 341 p., [4] p. of plates : $b ill. (some col.) ; $c 24 cm.
440  0 $a Oxford science publications
440  4 $a The International series of monographs on chemistry ; $v 17
504    $a Includes bibliographical references.
650  0 $a Secondary ion mass spectrometry.
700 10 $a Brown, A. Alan.
700 10 $a Reed, Nicola M.
700 10 $a Vickerman, J. C.
939    $a 1971696
941    $a 3
952    $l PLAX964 $d 20230718060340.0
952    $l OVUX522 $d 20180117033555.0
952    $l USUX851 $d 20160813103404.0
956    $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=4980E5682AE211DEBFD10D06A8D7520A

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