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01749pam a2200313 a 4500 001 9289989C2AD611DEA0647705A8D7520A 005 200904161733.0 008 910507s1991 nyua b 001 0 eng 010 $a 91019636 020 $a 9780306437922 020 $a 0306437929 040 $a DLC $c DLC $d SILO $d WEA $d IWA $d SILO 050 00 $a QC176.8.S8 $b I66 1991 082 00 $a 541.3/3 $2 20 245 0 $a Ion spectroscopies for surface analysis / $c edited by A.W. Czanderna and David M. Hercules. 260 $a New York : $b Plenum Press, $c c1991. 300 $a xvii, 469 p. : $b ill. ; $c 24 cm. 440 0 $a Methods of surface characterization ; $v v. 2 504 $a Includes bibliographical references and index. 505 0 $a Overview of ion spectroscopies for surface compositional analysis / A.W. Czanderna -- Surface structure and reaction studies by ion-solid collisions / Nicholas Winograd and Barbara J. Garrison -- Particle-induced desorption ionization techniques for organic mass spectrometry / Kenneth L. Busch -- Laser resonant and nonresonant photoionization of sputtered neutrals / Christopher H. Becker -- Rutherford backscattering and nuclear reaction analysis / L.C. Feldman -- Ion scattering spectroscopy / E. Taglauer -- Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS methods for surface compositional analysis / C.J. Powell, D.M. Hercules, and A.W. Czanderna. 650 0 $a Secondary ion mass spectrometry. 650 0 $a Solids $x Analysis. $x Analysis. 650 0 $a Surface chemistry. 700 10 $a Czanderna, Alvin Warren, $d 1930- 700 10 $a Hercules, David M., 939 $a 1172660 941 $a 1 952 $l USUX851 $d 20160816022125.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=9289989C2AD611DEA0647705A8D7520AInitiate Another SILO Locator Search