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03157aam a2200373 i 4500 001 C52866C66B5511E69AFE1DDBDAD10320 003 SILO 005 20160826010517 008 140502s2014 njua b 001 0 eng 010 $a 2014011448 020 $a 1118480481 (hardback) 020 $a 9781118480489 (hardback) 035 $a (OCoLC)873762508 040 $a DLC $e rda $b eng $c DLC $d YDX $d YDXCP $d BDX $d BTCTA $d OCLCF $d SILO 042 $a pcc 050 00 $a QD96.S43 V36 2014 082 00 $a 543/.65 $2 23 084 $a SCI013010 $2 bisacsh 100 1 $a Van der Heide, Paul, $d 1962- $e author. 245 10 $a Secondary ion mass spectrometry : $b an introduction to principles and practices / $c Paul van der Heide. 264 1 $a Hoboken, New Jersey : $b Wiley, $c [2014] 300 $a xvii, 365 pages ; $c 25 cm 504 $a Includes bibliographical references and index. 520 $a "This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"-- $c Provided by publisher. 500 $a Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes . 650 0 $a Secondary ion mass spectrometry. 650 7 $a SCIENCE / Chemistry / Analytic. $2 bisacsh 650 7 $a Secondary ion mass spectrometry. $2 fast $0 (OCoLC)fst01110604 776 08 $i Online version: $a Van der Heide, Paul, 1962- author. $t Secondary ion mass spectrometry $d Hoboken, New Jersey : John Wiley & Sons, Inc., [2014] $z 9781118916766 $w (DLC) 2014017866 856 42 $3 Cover image $u http://catalogimages.wiley.com/images/db/jimages/9781118480489.jpg 941 $a 1 952 $l USUX851 $d 20160826101335.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=C52866C66B5511E69AFE1DDBDAD10320 994 $a 92 $b IWAInitiate Another SILO Locator Search