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01301cam a22003134a 4500 001 F55157380F3E11DF93771FC5C41A358D 003 SILO 005 20100201083435 008 090529s2009 onca b 000 0 eng c 020 $a 9780921294504 020 $a 0921294506 035 $a (OCoLC)365068126 040 $a YDXCP $c YDXCP $d SILO $d IXA $d CGU $d IWA $d SILO 042 $a pcc 050 14 $a QD96 S43 S426 2009 245 0 $a Secondary ion mass spectrometry in the earth sciences : $b gleaning the big picture from a small spot / $c edited by Mostafa Fayek. 260 $a Toronto : $b Mineralogical Association of Canada, $c c2009. 300 $a viii, 150 p. : $b ill. ; $c 28 cm. 490 1 $a Short course series ; $v v. 41 500 $a "Short course sponsored by the Mineralogical Association of Canada and delivered at the 2009 joint assembly of the AGU, GAC, MAC, CGU and IAH, Toronto, Ontario, 22-23 May, 2009." 504 $a Includes bibliographical references. 650 0 $a Secondary ion mass spectrometry. 700 1 $a Fayek, Mostafa. 830 0 $a Short course series (Nepean, Ont.) ; $v v. 41. 941 $a 2 952 $l OVUX522 $d 20171228020843.0 952 $l USUX851 $d 20160825034440.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=F55157380F3E11DF93771FC5C41A358D 994 $a 02 $b IWAInitiate Another SILO Locator Search