The Locator -- [(author = "Air Force Wright Aeronautical Laboratories")]

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Author:
Mitchell, Michael A.
Title:
Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / Michael A. Mitchell, Loren W. Linholm ; sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.
Publisher:
For sale by the Supt. of Docs.U.S. G.P.O.,
For sale by the Supt. of Docs.U.S. G.P.O.,
Copyright Date:
1981
Description:
iv, 49 p. : ill. ; 27 cm.
Subject:
Electronic apparatus and appliances--Testing.
Integrated circuits--Testing.
Other Authors:
Linholm, Loren W.
United States. National Bureau of Standards.
Air Force Wright Aeronautical Laboratories.
Center for Electronics and Electrical Engineering (U.S.).
Notes:
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." Issued March 1981." Includes bibliographical references.
Series:
NBS special publication ; 400-65
Semiconductor measurement technology
LCCN:
80600197
Locations:
OVUX522 -- University of Iowa Libraries (Iowa City)

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