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01915cam a2200385Ia 4500 001 3C7A5AD02B0911DEBA4F1C08A8D7520A 005 200904162335.0 008 050128s2004 njuaf b 000 0 eng d 020 $a 9789812560254 (pbk.) 020 $a 9812560254 (pbk.) 035 $a (OCoLC)57515896 040 $a HCD $c HCD $d SILO $d IWA $d SILO 245 0 $a Fakebusters II : $b scientific detection of fakery in art and philately / $c edited by Richard J. Weiss and Duane Chartier. 246 3 $a Scientific detection of fakery in art and philately 260 $a Hackensack, N.J. : $a Hackensack, N.J. : $b World Scientific, $c c2004. 300 $a x, 317 p., [64] p. of plates : $b ill. (some col.) ; $c 23 cm. 440 0 $a Series in popular science ; $v vol. 4 500 $a "Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." 504 $a Includes bibliographical references. 650 0 $a Art $x Forgeries $v Congresses. 650 0 $a Art $x Radiography $v Congresses. 650 0 $a Art $x Expertising $v Congresses. 650 0 $a Expertising, X-ray $v Congresses. 650 0 $a Science and the arts $v Congresses. 650 0 $a Art and science $v Congresses. 700 1 $a Weiss, Richard J. $q (Richard Jerome), $d 1923- 700 1 $a Chartier, Duane R. 710 2 $a Society of Photo-optical Instrumentation Engineers. 710 2 $a International Center for Art Intelligence. 710 2 $a Philatelic Fakes Forgeries and Experts. 939 $a 5368759 941 $a 1 952 $l USUX851 $d 20160823030155.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=3C7A5AD02B0911DEBA4F1C08A8D7520A 994 $a 02 $b IWAInitiate Another SILO Locator Search