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01356pam a22003374a 4500 001 31369E6A2AFD11DE9D8A7A07A8D7520A 005 200904162209.0 008 000607s2000 paua b 101 0 eng 010 $a 00044791 020 $a 9781558994942 (hbk.) 020 $a 1558994947 (hbk.) 035 $a (OCoLC)44391723 040 $a DLC $c DLC $d SILO $d IWA $d SILO 050 00 $a TA418.7 I5246 2000 245 0 $a Interfacial engineering for optimized properties II : $b symposium held December 1-2, 1999, Boston, Massachusetts, U.S.A. / $c editors: C. Barry Carter ... [et al.]. 246 3 $a Interfacial engineering for optimized properties two 260 $a Warrendale, Pa. : $b Materials Research Society, $c c2000. 300 $a xi, 308 p. : $b ill. ; $c 24 cm. 440 0 $a Materials Research Society symposium proceedings ; $v v. 586 504 $a Includes bibliographical references and indexes. 650 0 $a Surfaces (Technology) $v Congresses. 650 0 $a Interfaces (Physical sciences) $v Congresses. 650 0 $a Grain boundaries. $v Congresses. 650 0 $a Surface chemistry. $v Congresses. 650 0 $a Thin films. $v Congresses. 700 1 $a Carter, C. Barry. 939 $a 4272190 941 $a 1 952 $l USUX851 $d 20160820083421.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=31369E6A2AFD11DE9D8A7A07A8D7520A 994 $a 02 $b IWAInitiate Another SILO Locator Search