The Locator -- [(subject = "Interferometry")]

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Author:
Serv©Ưn, Manuel, author.
Title:
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Mois©♭s Padilla.
Publisher:
Wiley-VCH Verlag GmbH & Co. KGaA,
Copyright Date:
2014
Description:
xvi, 327 pages : illustrations ; 25 cm
Subject:
Interferometry.
Optical measurements.
Interferometry--Mathematical models.
Optical measurements--Mathematical models.
Diffraction patterns.
Metrology.
Other Authors:
Quiroga, J. Antonio (Juan Antonio), author.
Padilla, J. Mois©♭s (Jos©♭ Mois©♭s), author.
Notes:
Includes bibliographical references and index.
Contents:
Digital linear systems -- Synchronous temporal interferometry -- Asynchronous temporal interferometry -- Spatial methods with carrier -- Spatial methods without carrier -- Phase unwrapping -- Appendix A : list of linear phase-shifting algorithms (PSAs).
ISBN:
3527411526 (print)
9783527411528 (print)
OCLC:
(OCoLC)884739610
Locations:
USUX851 -- Iowa State University - Parks Library (Ames)

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