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01627aam a2200349Ia 4500 001 BA92A6406B5511E69AFE1DDBDAD10320 003 SILO 005 20160826010517 008 140717t20142014gw a b 001 0 eng d 020 $a 3527411526 (print) 020 $a 9783527411528 (print) 035 $a (OCoLC)884739610 040 $a UKMGB $b eng $c UKMGB $d OCLCO $d BDX $d YDXCP $d IUL $d IWA $d SILO 050 4 $a QC39 S47x 2014 100 1 $a Serv©Ưn, Manuel, $e author. 245 10 $a Fringe pattern analysis for optical metrology : $b theory, algorithms, and applications / $c Manuel Servin, J. Antonio Quiroga, and J. Mois©âs Padilla. 264 1 $a Weinheim, Germany : $b Wiley-VCH Verlag GmbH & Co. KGaA, $c [2014] 300 $a xvi, 327 pages : $b illustrations ; $c 25 cm 504 $a Includes bibliographical references and index. 505 0 $a Digital linear systems -- Synchronous temporal interferometry -- Asynchronous temporal interferometry -- Spatial methods with carrier -- Spatial methods without carrier -- Phase unwrapping -- Appendix A : list of linear phase-shifting algorithms (PSAs). 650 0 $a Interferometry. 650 0 $a Optical measurements. 650 0 $a Interferometry $x Mathematical models. 650 0 $a Optical measurements $x Mathematical models. 650 0 $a Diffraction patterns. 650 0 $a Metrology. 700 1 $a Quiroga, J. Antonio $q (Juan Antonio), $e author. 700 1 $a Padilla, J. Mois©âs $q (Jos©â Mois©âs), $e author. 941 $a 1 952 $l USUX851 $d 20160826100531.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=BA92A6406B5511E69AFE1DDBDAD10320 994 $a C0 $b IWAInitiate Another SILO Locator Search