The Locator -- [(subject = "Interferometry")]

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01627aam a2200349Ia 4500
001 BA92A6406B5511E69AFE1DDBDAD10320
003 SILO
005 20160826010517
008 140717t20142014gw a     b    001 0 eng d
020    $a 3527411526 (print)
020    $a 9783527411528 (print)
035    $a (OCoLC)884739610
040    $a UKMGB $b eng $c UKMGB $d OCLCO $d BDX $d YDXCP $d IUL $d IWA $d SILO
050  4 $a QC39 S47x 2014
100 1  $a Serv©Ưn, Manuel, $e author.
245 10 $a Fringe pattern analysis for optical metrology : $b theory, algorithms, and applications / $c Manuel Servin, J. Antonio Quiroga, and J. Mois©♭s Padilla.
264  1 $a Weinheim, Germany : $b Wiley-VCH Verlag GmbH & Co. KGaA, $c [2014]
300    $a xvi, 327 pages : $b illustrations ; $c 25 cm
504    $a Includes bibliographical references and index.
505 0  $a Digital linear systems -- Synchronous temporal interferometry -- Asynchronous temporal interferometry -- Spatial methods with carrier -- Spatial methods without carrier -- Phase unwrapping -- Appendix A : list of linear phase-shifting algorithms (PSAs).
650  0 $a Interferometry.
650  0 $a Optical measurements.
650  0 $a Interferometry $x Mathematical models.
650  0 $a Optical measurements $x Mathematical models.
650  0 $a Diffraction patterns.
650  0 $a Metrology.
700 1  $a Quiroga, J. Antonio $q (Juan Antonio), $e author.
700 1  $a Padilla, J. Mois©♭s $q (Jos©♭ Mois©♭s), $e author.
941    $a 1
952    $l USUX851 $d 20160826100531.0
956    $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=BA92A6406B5511E69AFE1DDBDAD10320
994    $a C0 $b IWA

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