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02646aam a2200349 i 4500 001 A66817E8E9E711E69A6025A3DAD10320 003 SILO 005 20170203020341 008 160119s2016 wau b 001 0 eng c 010 $a 2016001116 020 $a 1510601562 020 $a 9781510601567 035 $a (OCoLC)936687197 040 $a OU/DLC $b eng $e rda $c OSU $d DLC $d OCLCF $d SPIES $d YDXCP $d TXA $d SILO 042 $a pcc 050 00 $a TA1555 Y36 2016 100 1 $a Yang, Lianxiang, $e author. 245 10 $a Digital shearography : $b new developments and applications / $c Lianxiang Yang, Xin Xie. 264 1 $a Bellingham, Washington USA : $b SPIE Press, $c [2016] 300 $a xii, 226 pages ; $c 26 cm 500 $a "With this book, written in memory of my PhD advisor, Professor Dr.-Ing. Wolfgang Steinchen (1939-2007)." 504 $a Includes bibliographical references and index. 520 $a "Since the second industrial revolution, the industry is always seeking for more efficient measuring and test methods in the aim of reaching higher production quality and reliability. With the invention of the first functioning laser in 1960, a modern evolution of optical measurement methods begins. Laser based modern optical measurement methods take the advantages of extremely high sensitive and noncontact, which make them as ideal ways for nondestructive, online and whole field test in industry applications. Shearography, also called speckle pattern shearing interferometry, is a laser speckle pattern interferometry based measurement technique. It measures the gradient of the deformation. In order to provide a better understanding of the digital shearography technique, this chapter gives a brief review of basic optics principles by reviewing the properties of laser, wave equations and speckle pattern phenomenon"-- $c Provided by publisher. 505 0 $a Review of basic optics principles -- Fundamentals of shearography metrology -- A brief review of digital shearography -- Principle of temporal phase-shift shearography -- Applications of temporal phase-shift shearography -- Fundamental of spatial phase-shift shearography -- Single carrier frequency spatial phase-shift shearography -- Spatial phase-shift shearography with multiple carrier frequencies -- Spatial phase-shift digital shearography for strain measurement. 650 0 $a Holographic interferometry. 650 0 $a Speckle. 650 0 $a Nondestructive testing. 700 1 $a Xie, Xin, $d 1988- $e author. 941 $a 1 952 $l USUX851 $d 20170405035230.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=A66817E8E9E711E69A6025A3DAD10320 994 $a C0 $b IWAInitiate Another SILO Locator Search