V.1: Magnetization characterization of superconductors / Common concepts in materials characterization, introduction / J.R. Cave, C. Lacroix. General vaccums techniques / Neil T. Peacock -- Mass and density measurements / David Dollimore, Alan C. Samuels -- Porosity and its measurement / Laura Espinal -- Thermometry / David Dollimore, Alan C. Samuels -- Symmetry in crystallography / Hugo Steinfink, Mihai Peterca -- Sample prepratation for metallography / Atul B. Gokhale, Sharbari Banerjee -- Atomic excitation exploited by energetic beam characterization methods / C. Jeynes, G.W. Grime -- Particle scattering / Robert Bastaz, Wolfgang Eckstein -- Combining data from multiple techniques / Chris J. Benmore -- Computation and theoretical methods ; Computation and theoretical methods, introduction / Juan M. Sanchez -- Introduction to computation / Marius Stan -- Bonding in metals / Richard E. Watson, Michael Weinert -- Summary of electronic structure methods / Mark van Schilfgaarde -- Magnetism in alloys / S.S.A. Razee ... [et. al] -- multiscale computational characterization / Marius Stan -- Handing time and temperature in materials simulations / Mira Todorova -- Prediction of phase diagrams / Didier de Fontaine -- Simulating microstructural evolution using the phase field method / Y. Wang, L.-Q. Chen, N. Zhou -- Challenges to structure prediction and structure characterization at the nanoscale / Sharon C. Glotzer, Aaron S. Keys, Eric Jankowski -- Molecular dynamics simulation of surface phenomena / Talat S. Rahman -- Binary and multicomponent diffusion / John Ågren -- Simulation of chemical vapor deposition processes / Chris R. Kleijn, Carlo Cavallotti -- Kinematic difraction of x-rays / Haydn Chen -- Dynamical diffraction / Qun Shen -- Computation of diffuse intensities in alloys / Duane D. Johnson -- Mechanical testing ; Mechanical testing, introduction / Reza Abbaschian -- Tension testing / Stephen D. Antolovich -- High-strain-rate testing of materials : the Split-Hopkinson pressure bar / George T. (Rusty) Gray III -- Fracture toughness testing methods / John Landes -- Hardness testing / Janice Edwards -- Tribological and wear testing / Raymond G. Bayer -- Characterizing micro and nanomaterials using MEMS technology / Yoshitada Isono -- Thermal analysis ; Thermal analysis, introduction / Lawrence P. Cook -- Principles and practices of thermal analysis and calorimetry / John Hill -- Thermogravimetric analysis / Sergey Vyazovkin -- Differential scanning calorimetry and differential thermal analysis / Christoph Schick, Dusan Lexa, Leonard Leibowitz -- Combustion calorimetry / P.A.G. O'Hare, Maria D.M.C. Ribeiro da Silva, Manuel A.V. Ribeiro da Silva -- Thermal diffusivity by the laser flash technique / Stephen F. Corbin, Dennis M. Turriff -- Simultaneous techniques including analysis of gaseous products / Quentin Lineberry, Wei-Ping Pan -- High temperature drop calorimetry / Edgar F. Vargas -- Electrical and electronic measurement ; Electrical and electronic measurements, introduction / Peter A. Barnes -- Conductivity measurement / Stuart M. Wentworth, Ronald Österbacka -- Hall effect and conductivity measurements in semiconductor crystals and thin films / Kalus Ellmer -- Capacitance-voltage (C-V) characterization of semiconductors / Peter A. Barnes -- Deep level transient spectroscopy / Chin-Che Tin -- Impedance spectroscopy of dielectrics and electronic conductors / Nikolaos Bonanos, Polycarpos Pissis, J. Ross Macdonald -- Electrical measurements on superconductors by transport / Hubertus W. Weijers, Patrick Noyes, Justin Schwartz -- Measuring the electronic properties of materials at the nanoscale / Lincoln J. Lauhon -- Characterization of pn junctions / Albert G. Baca -- Carrier lifetime : free carrier absorption, photoconductivity, and photoluminescence / Vytautas Grivickas, Jan Linnros -- Magnetism and magnetic measurement ; Magnetism and magnetic measurement, introduction / C.L. Chien -- Generation and measurement of magnetic fields / Charles H. Mielke ... [et. al] -- Magnetic moment and magnetization ; Theory of magnetic phase transitions / Michael E. Mchenry, David E. Laughlin -- Magnetometry / Robert P. Guertin, Simon Foner -- Thermomagnetic analysis / Michael E. Mchenry, Matthew S. Lucas -- Techniques to measure magnetic doman structures / R.J. Celotta, J. Unguris, M.H. Kelley, D.T. Pierce -- Magnetotransport in metals and alloys / Jack Bass -- Surface Magneto-optic Kerr effect / Ziqiang Qiu, Samuel D. Bader -- Magneto-optical characterization of magnetic thin films, surfaces, and interfaces at small length and short timescales / Andrei Kirilyuk ... [et. al] -- Magnetization characterization of superconductors / J.R. Cave, C. Lacroix. V. 2: In Situ x-ray measurement methods / Electrochemical techniques, introduction ; Cyclic voltammetry / Stuart R. Stock. Techniques for corrosion quantification / Gerald S. Frankel -- Semiconductor photoelectrochemistry / Samir J. Anz ... [et. al] -- Electrochemical impedance spectroscopy / Yevgen Barsukov, J. Ross Macdonald -- Potentiostatic and galvanostatic intermittent titration techniques / Mikhael D. Levi, Doron Aurbach -- Microelectrodes / Angela Molina, Joaquin Gonzalez -- Scanning electrochemical microscopy / Shigeru Amemiya -- Quartz crystal microbalance in electrochemistry / Georgia A. Arbuckle-Keil -- Optimal imaging and spectroscopy ; Introduction / Alan C. Samuels -- Optical microscopy / Jay L. Nadeau, Michael W. Davidson, Richard G. Connell, Jr. -- Super resolution optical microscopy / Jason J. Han, Andrew P. Shreve, James H. Werner -- Confocal fluorescence microscopy / Oleg D. Lavrentovich -- Ultraviolet and visible absorption spectroscopy / Brian M. Tissue -- Raman spectroscopy of solids / Thomas M. Devine, Fran Adar -- Fourier transform infrared (FTIR) spectroscopy / Jeffrey S. Gaffney, Nancy A. Marley, Darin E. Jones -- Ellipsometry / Lj. Arsov, M. Ramasubramanian, B.N. Popov -- Ultraviolet photoelectron spectroscopy / F.J. Himpsel -- Photoluminescence spectroscopy / Takeshi Aoki -- Resonance methods ; Resonance methods, introduction / Joseph P. Hornak -- Nuclear quadrupole resonance / Gerard S. Harbison -- Electron paramagnetic resonance / Gareth R. Eaton, Sandra S. Eaton -- Cyclotron resonance / D.J. Hilton, T. Arikawa, J. Kono -- Mössbauer spectrometry / Brent Fultz -- NMR spectroscopy in the solid state / Marcel Utz -- Nuclear magnetic resonance : basic principles and liquid state spectroscopy / Markus M. Hoffmann -- Applications of ferromagnetic resonance / J. Lindner, R. Meckenstock, M. Farle -- X-ray techniques ; X-ray techniques, introduction / Alan I. Goldman -- X-ray powder diffraction / Robert B. Von Dreele, Brian H. Toby -- Pair distribution functions analysis / Valeri Petkov -- Single crystal x-ray structure determination / Cesar Pay Gómez, Robert A. Jacobson -- X-ray diffraction and spectroscopic techniques for liquid surfaces and interfaces / David Vaknin -- Surface x-ray diffraction / Roberto Felici -- Coherent diffraction imaging of strain on the nanoscale / Ross Harder -- X-ray and neutron diffuse scattering measurements / Gene E. Ice, James L. Robertson, Cullie J. Sparks -- XAFS [x-ray absorption fine structure] spectroscopy / Steve Heald -- X-ray photoelectron spectroscopy / Jeffrey J. Weimer -- X-ray magnetic circular dichroism / Jonathan C. Lang -- Resonant scattering techniques / Kenneth D. Finkelstein, Vladimir E. Dmitrienko -- Resonant inelastic x-ray scattering / Bogdan M. Leu, E. Ercan Alp -- Magnetic x-ray scattering / Shibabrata Nandi -- X-ray microprobe for fluorescence and diffraction analysis / Gene E. Ice -- X-ray computed tomography / Stuart R. Stock -- High resolution 3 D imaging and material analysis with transmission x-ray microscopy and nano-CT / Yuxin Wang -- In Situ x-ray measurement methods / Stuart R. Stock. V. 3: Ultrasonic atomic force microscopy / Electron techniques, introduction / Kazushi Yamanaka, Toshihiro Tsuji. Transmission electron microscopy / James M. Howe, Brent Fultz, Shu Miao -- Scanning electron microscopy / Donovan N. Leonard, Gary W. Chandler, Supapan Seraphin -- Scanning transmission electron microscopy : z-contrast imaging / Stephen J. Pennycook -- In Situ TEM measurement methods / Pratibha L. Gai, Edward D. Boyes -- Dynamic transmission electron microscopy / James E. Evans, Katherine L. Jungjohann, Nigel D. Browning -- Lorentz microscopy / A.K. Petford-Long, M. De Graef -- Fluctuation electron microscopy / Paul Voyes, Jinwoo Hwang -- Low energy electron microscopy / J.I. Flege, W.X. Tang, M.S. Altman -- Spin-polarized low-energy electron microscopy (SPLEEM) / Alpha T. N'diaye, Adrian M. Quesada -- Low energy electron diffraction / Katariina Pussi, Renee D. Diehl -- Energy dispersive spectrometry / Dale E. Newbury -- Auger electron spectroscopy / John T. Grant -- Positron annihilation of materials / David J. Keeble ... [et. al] -- Reflection high energy electron diffraction / Shuji Hasegawa -- Ion beam techniques ; Ion beam methods, introduction / Chris Jeynes -- Total IBA. "Total" ion beam analysis - 3D imaging of complex samples using MeV ion beams / Chris Jeynes -- Particle induced x-ray emission / Miguel A. Reis, John L. Campbell -- Elastic backscattering of ions for compositional analysis / Chris Jeynes -- Elastic recoil detection analysis / Franc̦ois Schiettekatte, MArtin Chicoine -- Nuclear reaction analysis (NRA) and Particle induced gamma ray emission (PIGE) / Michael Kokkoris -- Low energy ion scattering / Hidde H. Brongersma -- Medium energy backscattering and forward recoil spectrometry / Robert A. Weller -- Secondary ion mass spectrometry / John F. watts, John Wolstenholme, Roger P. Webb -- Scanning helium ion microscopy / H.X. Guo, D. Fujita -- Atom probe tomography and field ion microscopy / M.K. Miller -- Charged particle irradiation for neutron radiation damage studies / Michael J. Fluss, Peter Hosemann, Jaime Marian -- Radiation effects microscopy / Annika Lohstroh -- Trace element accelerator mass spectrometry / Floyd Del Mcdaniel -- Neutron technique ; Neutron techniques, introduction / Alan I. Goldman -- Neutron powder diffraction / Thomas Vogt -- Single crystal neutron diffraction / Thomas F. Koetzle, Garry J. Mcintyre -- Phonon studies / Olivier A. Delaire, C. Stassis -- Neutron reflectometry / Helmut Fritzsche -- Small angle neutron scattering / Volker S. Urban -- Magnetic neutron scattering / Jeffrey W. Lynn -- Scanning probe techniques ; Scanning probe microscopy techniques, introduction / Alexander Schwarz -- Scanning tunneling microscopy / Jeong Y. Park -- Magnetic sensitive scanning tunneling microscopy / Kristen von Bergmann, André Kubetzka -- Atomic force microscopy and spectroscopy / Hendrik Hölscher, Jens Falter, André Schirmeisen -- Magnetic sensitive scanning probe microscopy / Ahmet Oral -- Electrostatic force microscopy and Kelvin probe force microscopy / Sascha Sadewasser, Clemens Barth -- Scanning near field optical microscopy / Michael R. Beversluis, Stephan J. Stranick -- Scanning thermal microscopy / Leonidas E. Ocola -- Ultrasonic atomic force microscopy / Kazushi Yamanaka, Toshihiro Tsuji.
Summary:
"A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"-- Provided by publisher.
This resource is supported by the Institute of Museum and Library Services under the provisions of the Library Services and Technology Act as administered by State Library of Iowa.