The Locator -- [(subject = "Vision--Congresses--Congresses")]

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Title:
Machine vision applications in industrial inspection II : 8-9 February 1994, San Jose, California / Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Publisher:
SPIE,
Copyright Date:
c1994
Description:
ix, 336 p. : ill. ; 28 cm.
Subject:
Computer vision--Congresses.--Congresses.
Quality control--Congresses.--Automation--Congresses.
Other Authors:
Dawson, Benjamin M.
Wilson, Stephen S.
Wu, Frederick Y.
IS & T--the Society for Imaging Science and Technology.
Society of Photo-optical Instrumentation Engineers.
Notes:
Includes bibliographical references and index.
Series:
Proceedings / SPIE--the International Society for Optical Engineering ; v. 2183
ISBN:
9780819414786 (pbk.)
0819414786 (pbk.)
OCLC:
(OCoLC)30040889
LCCN:
93087318
Locations:
OVUX522 -- University of Iowa Libraries (Iowa City)

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