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Title:

Leakage in nanometer CMOS technologies / [ed. by] Siva G. Narendra, Anantha Chandrakasan.

Publisher:

Springer,

Copyright Date:

c2006

Description:

x, 307 p. : ill. ; 24 cm.

Subject:

Metal oxide semiconductors, Complementary--Design and construction.
Integrated circuits--Design and construction.
Electric leakage--Prevention.

Other Authors:

Narendra, Siva G.
Chandrakasan, Anantha P.

Notes:

Includes bibliographical references and index.

Contents:

Case study : leakage reduction in the Intel Xscale microprocessor / Leakage dependence on input vector / Sagar Suthram, Siva Narendra, and Scott Thompson. Power gating and dynamic voltage scaling / Benton Calhoun, James Kao, and Anantha Chandrakasan - Methodologies for power gating / Kimiyoshi Usami and Takayasu Sakurai - Body biasing / Tadahiro Kuroda and Takayasu Sakurai - Process variation and adaptive design / Siva Narendra ... [et al.] - Memory leakage reduction / Takayuki Kawahara and Kiyoo Itoh - Active leakage reduction and multi-performance devices / Siva Narendra ... [et al.] - Impact of leakage power and variation on testing / Ali Keshavarzi and Kaushik Roy - Case study : leakage reduction in Hitachi/Renesas microprocessors / Masayuki Miyazaki, Hiroyuki Mizuno, and Takayuki Kawahara - Case study : leakage reduction in the Intel Xscale microprocessor / Lawrence Clark - Transistor design to reduce leakage / Sagar Suthram, Siva Narendra, and Scott Thompson.

Series:

Series on integrated circuits and systems

ISBN:

9780387281339
9780387281339 (e-book)
0387281339 (e-book)
9780387257372
0387257373

OCLC:

(OCoLC)62510295

Locations:

USUX851 -- Iowa State University - Parks Library (Ames)

UNUX074 -- University of Northern Iowa - Rod Library (Cedar Falls)