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01184aam a2200289I 4500 001 B795E738A18B11E6AED112AEDAD10320 003 SILO 005 20161103010209 008 151212s2016 ne a b 001 0 eng d 020 $a 0081000405 020 $a 9780081000403 035 $a (OCoLC)932174125 040 $a BTCTA $b eng $c BTCTA $d YDXCP $d BDX $d CDX $d OCLCO $d OCLCF $d LTSCA $d OCL $d SILO 050 4 $a TA417.2 M38 2016 245 00 $a Materials characterization using nondestructive evaluation (NDE) methods / $c edited by Gerhard HuÂbschen ... [et al.]. 260 $a Amsterdam ; $b Elsevier/Woodhead Publishing, $c 2016. 300 $a xv, 303 p. : $b ill. (some col.) $c 24 cm. 490 1 $a Woodhead Publishing series in electronic and optical materials ; $v number 88 504 $a Includes bibliographical references and index. 650 0 $a Nondestructive testing. 650 0 $a Materials $x Analysis. 700 1 $a Huebschen, Gerhard $4 edt 830 0 $a Woodhead Publishing series in electronic and optical materials ; $v no. 88. 941 $a 1 952 $l USUX851 $d 20201203013453.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=B795E738A18B11E6AED112AEDAD10320 994 $a C0 $b IWAInitiate Another SILO Locator Search