The Locator -- [(author = "Sira Limited")]

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Title:
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor, Sira Ltd.--The Research Association for Instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors.
Publisher:
SPIE--the International Society for Optical Engineering,
Copyright Date:
c1985
Description:
vi, 198 p. : ill. ; 28 cm.
Subject:
Optical instruments--Congresses.--Congresses.
Surfaces (Technology)--Congresses.
Other Authors:
Baker, L. R. (Lionel R.)
Bennett, Harold Earl, 1929-
Sira Limited.
Society of Photo-optical Instrumentation Engineers.
Notes:
Includes bibliographies and index.
Series:
Proceedings of SPIE--the International Society for Optical Engineering ; v. 525
ISBN:
9780892525607
0892525606
Locations:
USUX851 -- Iowa State University - Parks Library (Ames)
OVUX522 -- University of Iowa Libraries (Iowa City)

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