The Locator -- [(author = "Cohen Elaine")]

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Title:
NBS/RADC workshop, moisture measurement technology for hermetic semiconductor devices, II [microform]: proceedings of the NBS/RADC workshop held at the National Bureau of Standards, Gaithersburg, MD, November 5-7, 1980 / Elaine C. Cohen and Stanley Ruthberg, editors.
Format:
[microform]:
Publisher:
U.S. Dept. of CommerceNational Bureau of Standards :
Copyright Date:
1982
Description:
vi, 294 p. : ill. ; 28 cm.
Reproduction Info:
Microfiche.
Subject:
Moisture--Congresses.--Congresses.
Other Authors:
Ruthberg, Stanley.
Cohen, Elaine C.
Center for Electronics and Electrical Engineering (U.S.) Semiconductor Materials and Processes Division.
Rome Air Development Center.
Notes:
"Semiconductor Materials and Processes Division, Center for Electronic and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." "This activity was sponsored by Rome Air Development Center ... and National Bureau of Standards." "Issued April 1982." Includes bibliographical references.
Series:
NBS special publication ; 400-72
Semiconductor measurement technology
OCLC:
(OCoLC)711602646
Locations:
OVUX522 -- University of Iowa Libraries (Iowa City)

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