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Author:
Olney, Candida D.
Title:
A limited in-flight evaluation of the constant current loop strain measurement method
[microform] / Candida D. Olney and Joseph V. Collura.
Format:
[microform] /
Publisher:
National Aeronautics and Space AdministrationDryden Flight Research Center ;
Copyright Date:
1997
Description:
1 v.
Reproduction Info:
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.
Subject:
Strain measurement.
Strain gages
Wheatstone bridges.
Electrical measurement.
Electrical resistance.
Other Authors:
Collura, Joseph V.
Dryden Flight Research Facility
Notes:
Shipping list no.: 98-0799-M.
Series:
NASA technical memorandum 104331
OCLC:
(OCoLC)40471913
Locations:
USUX851 --
Iowa State University - Parks Library
(Ames)
OVUX522 --
University of Iowa Libraries
(Iowa City)
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