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01326nam a2200289Ia 4500 001 9D8EBAA22ADA11DE9482AC05A8D7520A 005 200904161802.0 008 851014s1985 waua b 10100 eng d 020 $a 9780892525607 020 $a 0892525606 040 $a LHL $c LHL $d SILO $d SILO 245 0 $a Measurement and effects of surface defects and quality of polish : $b January 21-22, 1985, Los Angeles, California / $c cosponsor, Sira Ltd.--The Research Association for Instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors. 260 0 $a Bellingham, Wash.: $b SPIE--the International Society for Optical Engineering, $c c1985. 300 $a vi, 198 p. : $b ill. ; $c 28 cm. 440 0 $a Proceedings of SPIE--the International Society for Optical Engineering ; $v v. 525 504 $a Includes bibliographies and index. 650 0 $a Optical instruments $x Congresses. $x Congresses. 650 0 $a Surfaces (Technology) $x Congresses. 700 10 $a Baker, L. R. $q (Lionel R.) 700 10 $a Bennett, Harold Earl, $d 1929- 710 20 $a Sira Limited. 710 20 $a Society of Photo-optical Instrumentation Engineers. 939 $a 1449701 941 $a 2 952 $l OVUX522 $d 20180102063201.0 952 $l USUX851 $d 20160806142038.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=9D8EBAA22ADA11DE9482AC05A8D7520AInitiate Another SILO Locator Search