The Locator -- [(author = "Cohen Elaine")]

24 records matched your query       


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01724aam a2200349 a 4500
001 C0A1E954EA6011E094823B976AFF544E
003 SILO
005 20110929010228
007 he umb---buca
008 820911s1982    dcua    bb   f100|0 eng d
035    $a (OCoLC)711602646
040    $a GPO $c GPO $d SILO $d MvI $d SILO
074    $a 247 (MF)
086 0  $a C 13.10:400-72
245 0  $a NBS/RADC workshop, moisture measurement technology for hermetic semiconductor devices, II $h [microform]: $b proceedings of the NBS/RADC workshop held at the National Bureau of Standards, Gaithersburg, MD, November 5-7, 1980 / $c Elaine C. Cohen and Stanley Ruthberg, editors.
260    $a Washington, D.C. : $b U.S. Dept. of Commerce, National Bureau of Standards : $c 1982.
300    $a vi, 294 p. : $b ill. ; $c 28 cm.
440  0 $a NBS special publication ; $v 400-72
440  0 $a Semiconductor measurement technology
533    $a Microfiche.
500    $a "Semiconductor Materials and Processes Division, Center for Electronic and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
500    $a "This activity was sponsored by Rome Air Development Center ... and National Bureau of Standards."
500    $a "Issued April 1982."
504    $a Includes bibliographical references.
650  0 $a Moisture $x Congresses. $x Congresses.
700 1  $a Ruthberg, Stanley.
700 1  $a Cohen, Elaine C.
710 2  $a Center for Electronics and Electrical Engineering (U.S.) $b Semiconductor Materials and Processes Division.
710 2  $a Rome Air Development Center.
941    $a 1
952    $l OVUX522 $d 20180118044447.0
956    $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=C0A1E954EA6011E094823B976AFF544E

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