75 records matched your query
01489aam a2200361 a 4500 001 7548EE5A65D311E6868A95C7DAD10320 003 SILO 005 20160819010408 007 he bmb024bbca 008 000217s1999 mdua bb f000 0 eng d 035 $a (OCoLC)43477967 040 $d GPO $d DLC $d MvI $d SILO 074 $a 0247-D (MF) 086 0 $a C 13.58:6415 100 1 $a Ling, Alice V. 245 10 $a Fast probing considerations for on-machine inspection of parts $h [microform] / $c Alice V. Ling, Neil D. Wilkin. 246 2 $a Fast probing considerations for on machine inspection of parts 260 $a Gaithersburg, MD : $b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, $c [1999] 300 $a 22 p. : $b ill. 440 0 $a NISTIR $v 6415 500 $a Shipping list no.: 2000-0127-M. 500 $a "October 1999." 504 $a Includes bibliographical references (p. 12). 533 $a Microfiche. $b [Washington, D.C.] : $c Supt. of Docs., U.S. G.P.O., $d [1999] $e 1 microfiche : negative. $7 s1999 dcun b 650 0 $a Probes (Electronic instruments) $x Calibration. 650 0 $a Machining $x Computer programs. 650 0 $a Machine parts $x Inspection. 700 1 $a Wilkin, Neil D. 710 2 $a National Institute of Standards and Technology (U.S.) 941 $a 2 952 $l OVUX522 $d 20180104034511.0 952 $l USUX851 $d 20160819034058.0 956 $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=7548EE5A65D311E6868A95C7DAD10320Initiate Another SILO Locator Search