75 records matched your query       

01489aam a2200361 a 4500
001 7548EE5A65D311E6868A95C7DAD10320
003 SILO
005 20160819010408
007 he bmb024bbca
008 000217s1999    mdua    bb   f000 0 eng d
035    $a (OCoLC)43477967
040    $d GPO $d DLC $d MvI $d SILO
074    $a 0247-D (MF)
086 0  $a C 13.58:6415
100 1  $a Ling, Alice V.
245 10 $a Fast probing considerations for on-machine inspection of parts $h [microform] / $c Alice V. Ling, Neil D. Wilkin.
246 2  $a Fast probing considerations for on machine inspection of parts
260    $a Gaithersburg, MD : $b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, $c [1999]
300    $a 22 p. : $b ill.
440  0 $a NISTIR $v 6415
500    $a Shipping list no.: 2000-0127-M.
500    $a "October 1999."
504    $a Includes bibliographical references (p. 12).
533    $a Microfiche. $b [Washington, D.C.] : $c Supt. of Docs., U.S. G.P.O., $d [1999] $e 1 microfiche : negative. $7 s1999 dcun b
650  0 $a Probes (Electronic instruments) $x Calibration.
650  0 $a Machining $x Computer programs.
650  0 $a Machine parts $x Inspection.
700 1  $a Wilkin, Neil D.
710 2  $a National Institute of Standards and Technology (U.S.)
941    $a 2
952    $l OVUX522 $d 20180104034511.0
952    $l USUX851 $d 20160819034058.0
956    $a http://locator.silo.lib.ia.us/search.cgi?index_0=id&term_0=7548EE5A65D311E6868A95C7DAD10320